Equipment

Qualification / Reliability Equipment Test Industry Standard Test Conditions Equipment HTOL JEDEC-STD-22, A108-C 1000 hours, 125C MCC HPB-5A, HPB-5B, Aehr Max 3, 4 Criteria THB EIA/JESD22A101-B 1000 hours, biased 85C, 85%RH Espec C-SAM JEDEC-STD-20 Variable Hitachi Pre-Conditioning JESD-22-A113-D Various conditions Espec I/R (solder) Reflow JESD-22-A113-D 240 or 260C Heller Temperature Cycling JESD-22-A104 Various conditions Ransco Highly-Accelerated Temp and Humidity Stress Test JESD-22-A110-B 96 hours, biased, 130C/85%RH Hirayama Accelerated Moisture Resistance-Unbiased HAST JESD-22-A118 A: 96 hours, 130C B: 264 hours, 110C Hirayama High Temperature Storage JESD-22-A103-C 1000 hours, Unbiased, 150C Espec Autoclave JESD-22-A102-C 168 hours, 100%RH, 121C, 2atm Espec ESD & Latch-Up JESD22-C101 JEDEC 78 Various Conditions Zapmaster MK.4 Failure Analysis Equipment Test Equipment & Model Scanning Electron Microscopes JEOL JSM-6700F Scanning Acoustic Microscopy Sonoscan CSAM D-9000 Optical Inspection Olympus SZX12, BHMJL Package Decapsulation NSC PS101 system B&G 250 system X-ray Imaging CRX 1000 Backside Sample Preparation Ultra Tec ASAP-1 Metallographic polishing Allied High-Tech planar polishing system Electrical Bench Equipment (Assorted test equipment) ATE Specifications Testing Equipment Manufacturer Test Platform Configuration Agilent HP83000 (F50T) Software Revision: Unix rev 10.2, Smartest rev 5.3.4 Testhead: 244 I/O Channels, 10101-11516 @4M, 13209.13216@8m, 64M scan PDPS channels + 4 DPS (6624) HP93000 (P1000) Software revision: Unix 10.2 Smartest 3.2.21 Unix rev 11.1 Smartest 4.3.10. or Smartest 3.2.21 Testhead: 1024 channels (576 digital & 64 NP installed) with analog options 16 DPS channels available

Testing Equipment Manufacturer Test Platform Configuration CREDENCE ASL 1000 1 OVI (Octo Voltage Current Source) 2 OVI (Octo Voltage Current Source) 3 OVI (Octo Voltage Current Source) 4 PV3 (Pulse Voltage) (Current Source 100 AMP) 5 ACS (AC Source) 6 TMU ( Time Measurement Unit) 7 DDD ( Digital Drive Detector) 8 OAL ( Op Amp Loop) 9 DVI (Dual Voltage Current Source) 11 DVI ( 2000) 2 Amp's ( Dual Voltage Current Source) 13 DVI ( Dual Voltage Current Source) 14 MUX ( Multiplexer) 15 HVS ( High Voltage Source) 17 DVI ( Dual Voltage Current Source) 19 DVI ( Dual Voltage Current Source) 20 MUX ( Multiplexer) STS 6256 256 Pins or Channels 4 KB Vector Memory per Pin or Channel 1 MB EVM 3 each DPS

Testing Equipment Manufacturer Test Platform Configuration TERADYNE CATALYST 400 256 High Speed Digital Channels 4 Meg LVM Pattern Memory Dual Pattern Generators No SCAN Option Analog Instrumentation : Slot 5 (TMS) Time Measurement System Slot 6 (GIGADIG) 1GHz High Frequency Digitizer Slot 7 (VHFAWG2500) 2.5 Ghz High Frequency Arbitrary Wave form Generator Slot 11 (VHFDIG) High Frequency Digitizer Slot 14 (VHFAWG400) 400 Mhz High Frequency Arbitrary Wave Form Generator Slot 16 (UWMM) Microwave Measure Module Slot 18 (UWPORT) Microwave Port Slot 19 (UHFSRC) Ultra High Frequency Source Slot 22 (TJD) Time Jitter Digitizer DUTSRC'S 1 UBVI 2 HCU 3 HCU 4 HCU Matrix SRC'S 1 UBVI 2 UBVI 3 UBVI 4 HCU 5 UBVI CATALYST 400 256 High Speed Digital Channels 4 Meg Pattern Memory Dual Pattern Generators Scan Option Analog Instrumentation : Slot 5 (TMS) Time Measurement System Slot 22 (TJD) Time Jitter Digitizer 2 (HCLK) Pico Clocks 48 (XPT) DC Matrix Lines DUTSRC'S 1 UBVI 2 HCU 3 HCU 4 HCU 5 UBVI Matrix SRC'S 1 UBVI 2 UBVI 3 UBVI 4 HCU 5 UBVI CATALYST 400 256 High Speed Digital Channels 4 Meg LVM Pattern Memory Scan Option Analog Instrumentation : Slot 5 (TMS) Time Measurement System Slot 22 (TJD) Time Jitter Digitizer 2 (HCLK) Pico Clocks 48 (XPT) DC Matrix Lines DUTSRC'S 1 UBVI 2 HCU 3 HCU 4 HCU 5 UBVI Matrix SRC'S 1 UBVI 2 UBVI 3 UBVI 4 HCU 5 UBVI CATALYST TIGER 1024 HSD Channels 16 Meg LVM Pattern Memory Dual Pattern Generators Scan Option Analog Instrumentation : Slot 5 (TJA) Time Jitter Analyzer 48 (XPT) DC Matrix Lines DUTSRC'S 1 UBVI 2 HCU 3 HCU Matrix SRC'S 1 UBVI 2 UBVI (QVS) Quad Voltage Sources 1 QVS 2 QVS 3 QVS 4 QVS J750 512 Digital Pins ( 8 Digital Channel Boards) 100 MHz Data Rate 8M Vector Memory 16 Device Power Supplies ( 2 DPS Boards) J750 256 Digital Pins ( 4 Digital Channel Boards) 100 MHz Data Rate, 8 MEG Vector Memory 1 CTO ( Converter Test Option), 1 MTO ( Memory Test Option) on Pins 1-64 32 Device Power Supplies ( 4 DPS Boards) J750 512 Digital Pins ( 8 Digital Channel Boards) 100 MHz Data Rate, 16 M Vector Memory 1 CTO ( Converter Test Option), 1 MTO ( Memory Test Option) on Pins 1-64 16 Device Power Supplies ( 2 DPS Boards)