ATE Specifications

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ATE Specifications

Testing Equipment
Manufacturer	Test Platform	Configuration
Agilent	HP83000 (F50T)	Software Revision: Unix rev 10.2, Smartest rev 5.3.4 Testhead: 244 I/O Channels, 10101-11516 @4M, 13209.13216@8m, 64M scan PDPS channels + 4 DPS (6624)
Agilent	HP93000 (P1000)	Software revision: Unix 10.2 Smartest 3.2.21 Unix rev 11.1 Smartest 4.3.10. or Smartest 3.2.21 Testhead: 1024 channels (576 digital & 64 NP installed) with analog options 16 DPS channels available

Testing Equipment
Manufacturer	Test Platform	Configuration
CREDENCE	ASL 1000	1 OVI (Octo Voltage Current Source) 2 OVI (Octo Voltage Current Source) 3 OVI (Octo Voltage Current Source) 4 PV3 (Pulse Voltage) (Current Source 100 AMP) 5 ACS (AC Source) 6 TMU ( Time Measurement Unit) 7 DDD ( Digital Drive Detector) 8 OAL ( Op Amp Loop) 9 DVI (Dual Voltage Current Source) 11 DVI ( 2000) 2 Amp's ( Dual Voltage Current Source) 13 DVI ( Dual Voltage Current Source) 14 MUX ( Multiplexer) 15 HVS ( High Voltage Source) 17 DVI ( Dual Voltage Current Source) 19 DVI ( Dual Voltage Current Source) 20 MUX ( Multiplexer)
CREDENCE	STS 6256	256 Pins or Channels 4 KB Vector Memory per Pin or Channel 1 MB EVM 3 each DPS

Testing Equipment

Manufacturer

Test Platform

Configuration

TERADYNE

CATALYST 400

256 High Speed Digital Channels
4 Meg LVM Pattern Memory
Dual Pattern Generators
No SCAN Option
Analog Instrumentation :
Slot 5 (TMS) Time Measurement System
Slot 6 (GIGADIG) 1GHz High Frequency Digitizer
Slot 7 (VHFAWG2500) 2.5 Ghz High Frequency Arbitrary Wave form Generator
Slot 11 (VHFDIG) High Frequency Digitizer
Slot 14 (VHFAWG400) 400 Mhz High Frequency Arbitrary Wave Form Generator
Slot 16 (UWMM) Microwave Measure Module
Slot 18 (UWPORT) Microwave Port
Slot 19 (UHFSRC) Ultra High Frequency Source
Slot 22 (TJD) Time Jitter Digitizer

DUTSRC'S
1 UBVI
2 HCU
3 HCU
4 HCU

Matrix SRC'S
1 UBVI
2 UBVI
3 UBVI
4 HCU
5 UBVI

CATALYST 400

256 High Speed Digital Channels
4 Meg Pattern Memory
Dual Pattern Generators
Scan Option
Analog Instrumentation :
Slot 5 (TMS) Time Measurement System
Slot 22 (TJD) Time Jitter Digitizer
2 (HCLK) Pico Clocks
48 (XPT) DC Matrix Lines

DUTSRC'S
1 UBVI
2 HCU
3 HCU
4 HCU
5 UBVI

Matrix SRC'S
1 UBVI
2 UBVI
3 UBVI
4 HCU
5 UBVI

CATALYST 400

256 High Speed Digital Channels
4 Meg LVM Pattern Memory
Scan Option
Analog Instrumentation :
Slot 5 (TMS) Time Measurement System
Slot 22 (TJD) Time Jitter Digitizer
2 (HCLK) Pico Clocks
48 (XPT) DC Matrix Lines

DUTSRC'S
1 UBVI
2 HCU
3 HCU
4 HCU
5 UBVI

Matrix SRC'S
1 UBVI
2 UBVI
3 UBVI
4 HCU
5 UBVI

CATALYST TIGER

1024 HSD Channels
16 Meg LVM Pattern Memory
Dual Pattern Generators
Scan Option
Analog Instrumentation :
Slot 5 (TJA) Time Jitter Analyzer
48 (XPT) DC Matrix Lines

DUTSRC'S
1 UBVI
2 HCU
3 HCU

Matrix SRC'S
1 UBVI
2 UBVI

(QVS) Quad Voltage Sources
1 QVS
2 QVS
3 QVS
4 QVS

J750

512 Digital Pins ( 8 Digital Channel Boards)
100 MHz Data Rate
8M Vector Memory
16 Device Power Supplies ( 2 DPS Boards)

J750

256 Digital Pins ( 4 Digital Channel Boards)
100 MHz Data Rate, 8 MEG Vector Memory
1 CTO ( Converter Test Option), 1 MTO ( Memory Test Option) on Pins 1-64
32 Device Power Supplies ( 4 DPS Boards)

J750

512 Digital Pins ( 8 Digital Channel Boards)
100 MHz Data Rate, 16 M Vector Memory
1 CTO ( Converter Test Option), 1 MTO ( Memory Test Option) on Pins 1-64
16 Device Power Supplies ( 2 DPS Boards)