C4 Vertical and Cantilever Probe Card Maintenance, Repair, and Rebuild service

DSL Labs offers added services to prolong the life of probe card investment with our on site repair and refurbishing capabilities. With routine cleaning and preventative maintenance performed by DSL skilled technicians, probe cards will continue to provide positive test results and prevent unnecessary yield loss at the wafer test level.

Preventative maintenance designed to optimize the performance of the probe card is variable and is dependent on the conditions that the probe card has been used. Some factors determining probe card 'length of life' include:proper handling and storage procedures,overdrive and contact force levels, on line cleaning/customer in house maintenance, edge sensor usage, probe equipment settings, wafer pad material and condition.

Determining the correct service of an individual probe card requires an incoming diagnosis be performed through a series of inspections. Carefully examining under a microscope, DSL technicians visually inspect the condition of the probe card for damage to the probe tips. If there are no indications of catastrophic damaged by impact, or too high a percentage of damaged probes, measurements are then taken. Measurements along with visual inspection determine the total condition of the probes, and whether it is repairable or at "end of life", indicating a total replacement of the probe ring or C4 probe head.

DSL Lab's Incoming Measurements

• Planarity, Verify Planarity is within Manufacturing Specifications
• Alignment, Verify Alignment is within Manufacturing Specifications
• Tip Diameter, Verify the Tip Diameter is within Tolerance
• Tip Lengths, Verify Tip Length is within Tolerance
• Inspect and Measure Edge Sensor probe tips if applicable

DSL Lab's Incoming inspection will also check for:

• Bent, broken, split probes
• Visual defects such as cold solder joints, excess solder, and flux
• Wiring and Components
• Epoxy condition
• Condition of Plating on MLO Probe Pads
• PCB condition
• Burnt Probes
• Burnt or Damaged Dies